Commonly used detection methods Commonly used detection methods for integrated circuits are on-line measurement, off-line measurement, and substitution. 1. Non-online measurement Non-online measurement tide When the integrated circuit is not soldered into the circuit, the DC resistance value between each pin is compared with the DC resistance value between the pins of the known normal integrated circuit. To determine if it is normal. 2. On-line measurement On-line measurement method uses voltage measurement method, resistance measurement method and current measurement method to judge whether the integrated circuit is normal by measuring whether the voltage value, resistance value and current value of each pin of the integrated circuit are normal on the circuit. damage. 3. Substitution method is to replace the integrated circuit under test with the same type of integrated circuit of the same type and the same specification, and it can be judged whether the integrated circuit is damaged. (2) Detection of commonly used integrated circuits 1. Microprocessor integrated circuit detection The key test pins of the microprocessor integrated circuit are VDD power supply terminal, RESET reset terminal, XIN crystal oscillator signal input terminal, XOUT crystal oscillator signal output terminal and other line input and output terminals. Measure the resistance and voltage values ​​of these key feet to the ground to see if they are the same as normal values ​​(can be found in the product circuit diagram or related maintenance data). The RESET reset voltage of different types of microprocessors is also different, and some are low-level reset, that is, low level at the moment of power-on, and high level after reset; some are high-level reset, that is, high level at the moment of switching. Maintain low after reset. 2. Switching power supply integrated circuit detection The key voltage of the switching power supply integrated circuit is the power supply terminal (VCC), the excitation pulse output terminal, the voltage detection input terminal, and the current detection input terminal. Measure the voltage value and resistance value of each pin to ground. If the difference between the normal value and the normal value is large, it can be determined that the integrated circuit is damaged when the peripheral components are normal. The thick film integrated circuit with built-in high-power switch tube can also determine whether the switch tube is normal by measuring the positive and negative resistance values ​​between the C, B and E poles of the switch tube. 3. Detection of audio power amplifier integrated circuit When checking the audio power amplifier integrated circuit, the voltage value and resistance value of the power supply terminal (positive power supply terminal and negative power supply terminal), audio input terminal, audio output terminal and feedback terminal to ground should be detected first. If the data value of each pin is found to be different from the normal value, and the peripheral components are normal, the internal damage of the integrated circuit is caused. For an audio power amplifier integrated circuit that causes a silent fault, when the power supply voltage is normal, it can be checked by the signal interference method. When measuring, the multimeter should be placed in the R×1 file, the red test lead should be grounded, and the audio input should be touched with the black test lead. In normal time, there should be a strong “click†sound in the speaker. 4. The detection of the operational amplifier integrated circuit uses the multimeter DC voltage file to measure the voltage value between the output terminal of the operational amplifier and the negative power supply terminal (the voltage value is higher when static). Use the hand-held metal tweezers to touch the two inputs of the op amp (adding interference signals). If the multimeter's hands have a large amplitude, the op amp is intact; if the multimeter does not move, the op amp is damaged. 5. Time-base integrated circuit detection time base integrated circuit contains digital circuit and analog circuit, it is difficult to directly measure its quality with a multimeter. The test circuit shown in Figure 9-13 can be used to detect the quality of the time base integrated circuit. The test circuit consists of a RC component, an LED, a 6V DC power supply, a power switch S and an 8-pin IC socket. After inserting the time base integrated circuit (such as NE555) into the IC socket, press the power switch S. If the time base integrated circuit is normal, the LED will flash and emit light; if the LED is not bright or always bright, the measured is measured. Time base integrated circuit performance is poor. Concerned about surprises Label: Commonly used detection methods for integrated circuits Previous: What are the forms and advantages and disadvantages of ground source heat pump systems? Next: The shape of the manhole cover and its scope of application Material :Natural slate , quartz,sandstone ,marble etc . Slate Mosaic,Slate Mosaic Tile,Slate Mosaic Wall Tiles,Slate Stone Mosaic HEBEI DFL STONE , https://www.dflstone.com
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